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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 5 — May. 1, 1974
  • pp: 1115–1120

High Precision Alignment Procedure for an Ellipsometer

J. R. Zeidler, R. B. Kohles, and N. M. Bashara  »View Author Affiliations


Applied Optics, Vol. 13, Issue 5, pp. 1115-1120 (1974)
http://dx.doi.org/10.1364/AO.13.001115


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Abstract

Beam deviation in the polarizing elements is identified as a significant source of error in existing ellipsometer alignment procedures. A high precision alignment procedure that eliminates these errors is described. This procedure is less time consuming than previous methods, and its accuracy is comparable to the limit of resolution of the ellipsometer (typically 0.01–0.005°). A further advantage of this procedure is that it provides a precise method for the alignment of specimens and lasers with the ellipsometer.

© 1974 Optical Society of America

History
Original Manuscript: August 6, 1973
Published: May 1, 1974

Citation
J. R. Zeidler, R. B. Kohles, and N. M. Bashara, "High Precision Alignment Procedure for an Ellipsometer," Appl. Opt. 13, 1115-1120 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-5-1115

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