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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 5 — May. 1, 1974
  • pp: 1179–1183

Laser Pattern Generation Using X–Y Beam Deflection

J. Raamot and V. J. Zaleckas  »View Author Affiliations


Applied Optics, Vol. 13, Issue 5, pp. 1179-1183 (1974)
http://dx.doi.org/10.1364/AO.13.001179


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Abstract

A laser pattern generator has been developed using galvanometers for x-y beam deflection. The system can be operated in a random access mode, using optical beam position detection with digital computer control. In addition, it can be operated as a flying spot scanner in a raster type scan format using master transparency interrogation to produce simultaneously a laser machined copy of the master. In either mode, the system is characterized by high accuracy, high speed laser machining over a large field.

© 1974 Optical Society of America

History
Original Manuscript: November 21, 1973
Published: May 1, 1974

Citation
J. Raamot and V. J. Zaleckas, "Laser Pattern Generation Using X–Y Beam Deflection," Appl. Opt. 13, 1179-1183 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-5-1179


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References

  1. B. N. Szabados, N. K. Sinah, C. D. DiCenzo, IEEE Trans. Ind. Electron. Contr. Instrum. 69 (1972).
  2. D. E. O’Brien, “Sensitivity Analysis of the Optimal Regulator Control of a Galvanometer Beam Deflection System,” Masters Thesis, Lehigh University (1973).

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