Abstract

Refractive index measurements of layer structure crystals of ZnIn₂S₄ were performed over the 0.45–1.25 μm wavelength range. An improved interferometric method that allowed a precision of 0.2% in the n(λ) values was used.

© 1974 Optical Society of America

Refractive Index Profile Measurements of Diffused Optical Waveguides

W. E. Martin
Appl. Opt. 13(9) 2112-2116 (1974)

CO₂ Laser Absorption Coefficients for Determining Ambient Levels of O₃, NH₃, and C₂H₄

R. R. Patty, G. M. Russwurm, W. A. McClenny, and D. R. Morgan
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Refractive Index and Diameter Determinations of Step Index Optical Fibers and Preforms

H. M. Presby and D. Marcuse
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Measuring the Refractive Index and Thickness of Thin Transparent Films: Method

V. Daneu and A. Sanchez
Appl. Opt. 13(1) 122-128 (1974)

Temperature dependence of index of refraction, reflection, and extinction coefficient of liquid sulfur in the 0.4–2.0-μm wavelength range

R. Sasson and E. T. Arakawa
Appl. Opt. 25(16) 2675-2680 (1986)