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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 13, Iss. 9 — Sep. 1, 1974
  • pp: 2052–2060

Imaging Characteristics of the Itek PROM

S. G. Lipson and P. Nisenson  »View Author Affiliations


Applied Optics, Vol. 13, Issue 9, pp. 2052-2060 (1974)
http://dx.doi.org/10.1364/AO.13.002052


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Abstract

This paper discusses advances in the fabrication, operation, and performance of the Itek PROM (Pockels readout optical modulator). Devices of high optical quality have been made and evaluated. Measurements of MTF and sensitivity under various conditions are presented. Stored images can be enhanced in contrast by a change in device voltage and the same method used to suppress the zero order in Fraunhofer diffraction patterns of such images. The results of this technique are demonstrated.

© 1974 Optical Society of America

History
Original Manuscript: January 25, 1974
Published: September 1, 1974

Citation
S. G. Lipson and P. Nisenson, "Imaging Characteristics of the Itek PROM," Appl. Opt. 13, 2052-2060 (1974)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-13-9-2052


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References

  1. P. Vohl, P. Nisenson, D. S. Oliver, IEEE Trans. Electron Devices ED-20, 1023 (1973); P. Nisenson, S. Iwasa, Appl. Opt. 11, 2760 (1972); J. Feinleib, D. S. Oliver, Appl. Opt. 11, 2752 (1972); S. L. Hou, D. S. Oliver, Appl. Phys. Lett. 18, 25 (1971); S. Iwasa, J. Feinleib, Optical Engineering, to be published. [CrossRef] [PubMed]
  2. Manufactured by the Union Carbide Corporation.
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  6. G. Groh, G. Mane, Opt. Commun. 2, 133 (1970). [CrossRef]
  7. J. Donjon, F. Dumont, M. Grenot, J. P. Hazan, G. Marie, J. Pergrale, IEEE Trans. Electron Devices ED-20, 1037 (1973). [CrossRef]
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  9. J. C. Urbach, R. W. Meier, Appl. Opt. 8, 2269 (1969). [CrossRef] [PubMed]
  10. A. Labeyrie, Astron. Astrophys. 6, 85 (1970); D. Y. Gezari, A. Labeyrie, R. V. Stachnik, Astrophys. J. 173, L1 (1972). [CrossRef]

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