Refractive index profiles resulting from the fabrication of optical waveguides by diffusion techniques are measured using a reflection interferometric technique. In Cd-diffused ZnSe waveguides, the index variations are found to be complementary error functions that closely follow the composition changes for deep (>5 μm) diffusions. Shallow (<5 μm) diffusions produce waveguides in which the index profile is a complementary error function that differs significantly from the composition profile. The relationship between composition and refractive index is determined for Cd compositions less than 10%. Refractive index profiles in commercially available diffused glass waveguides (SELFOC rod and fibers) are also described.
© 1974 Optical Society of America
Original Manuscript: March 1, 1974
Published: September 1, 1974
W. E. Martin, "Refractive Index Profile Measurements of Diffused Optical Waveguides," Appl. Opt. 13, 2112-2116 (1974)