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Applied Optics

Applied Optics


  • Vol. 13, Iss. 9 — Sep. 1, 1974
  • pp: 2112–2116

Refractive Index Profile Measurements of Diffused Optical Waveguides

W. E. Martin  »View Author Affiliations

Applied Optics, Vol. 13, Issue 9, pp. 2112-2116 (1974)

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Refractive index profiles resulting from the fabrication of optical waveguides by diffusion techniques are measured using a reflection interferometric technique. In Cd-diffused ZnSe waveguides, the index variations are found to be complementary error functions that closely follow the composition changes for deep (>5 μm) diffusions. Shallow (<5 μm) diffusions produce waveguides in which the index profile is a complementary error function that differs significantly from the composition profile. The relationship between composition and refractive index is determined for Cd compositions less than 10%. Refractive index profiles in commercially available diffused glass waveguides (SELFOC rod and fibers) are also described.

© 1974 Optical Society of America

Original Manuscript: March 1, 1974
Published: September 1, 1974

W. E. Martin, "Refractive Index Profile Measurements of Diffused Optical Waveguides," Appl. Opt. 13, 2112-2116 (1974)

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  1. H. F. Taylor, W. E. Martin, D. B. Hall, V. N. Smiley, Appl. Phys. Lett. 21, 95 (1972). [CrossRef]
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