Effect of Dispersion on the Reflection and Transmission Extrema from a Monolayer
Applied Optics, Vol. 14, Issue 3, pp. 640-642 (1975)
http://dx.doi.org/10.1364/AO.14.000640
Acrobat PDF (335 KB)
Abstract
The use of the quarter-wave optical thickness concept in the design of certain types of multilayer optical filters, or in the thickness determination of optical thickness of monolayers from transmission or reflection data, can present appreciable errors if dispersion is present in the layer optical constants. Moderate amounts of dispersion can cause significant shifts in the location of the global reflection or transmission extrema from what would be predicted using simple optical thickness considerations. Examples, including the use of measured index of refraction values for CeO2, are presented.
Citation
James W. Seeser, "Effect of Dispersion on the Reflection and Transmission Extrema from a Monolayer," Appl. Opt. 14, 640-642 (1975)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-14-3-640
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription





OSA is a member of 