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Applied Optics

Applied Optics


  • Vol. 15, Iss. 10 — Oct. 1, 1976
  • pp: 2339–2343

Electric fields in multilayers at oblique incidence

Joseph H. Apfel  »View Author Affiliations

Applied Optics, Vol. 15, Issue 10, pp. 2339-2343 (1976)

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The recursion equation for electric field strength in a multilayer thin film system yields only the tangential component of the field. This paper discusses the relationship between the tangential component, the peak value, and the time average value of the total electric field for the two planes of polarization. This approach leads to easy understanding of the discontinuous field strength for p polarization and the relationship between the peak and time average field strengths. The results are applied to a polarizing beam splitter of the type used with high energy lasers.

© 1976 Optical Society of America

Original Manuscript: February 6, 1976
Published: October 1, 1976

Joseph H. Apfel, "Electric fields in multilayers at oblique incidence," Appl. Opt. 15, 2339-2343 (1976)

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  1. D. Kossel, K. Deutscher, K. Hirschberg, Physics of Thin Films (Academic, New York, 1969), Vol. 5, pp. 1–45.
  2. W. W. Buchman, Appl. Opt. 14, 1220 (1975).
  3. R. H. Miller, Opt. Spectra 9 (7), 32 (1975).
  4. B. F. Newnam, D. H. Gill, G. Faulkner, NBS Special Publication No. 435, 254 (1976).
  5. L. Levi, Applied Optics (Wiley, New York, 1968), p. 51.
  6. P. H. Berning, Physics of Thin Films (Academic, New York, 1963), Vol. 1, pp. 69–121.
  7. J. M. Stone, Radiation and Optics (McGraw-Hill, New York, 1963), p. 394.

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