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Applied Optics

Applied Optics


  • Vol. 15, Iss. 11 — Nov. 1, 1976
  • pp: 2701–2704

Vibration phase mapping using electronic speckle pattern interferometry

Ole J. Løkberg and Kåre Høgmoen  »View Author Affiliations

Applied Optics, Vol. 15, Issue 11, pp. 2701-2704 (1976)

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The contours of constant phases across sinusoidally vibrating objects have been mapped using reference wave phase modulation in time-average electronic speckle pattern interferometry.

© 1976 Optical Society of America

Original Manuscript: May 27, 1976
Published: November 1, 1976

Ole J. Løkberg and Kåre Høgmoen, "Vibration phase mapping using electronic speckle pattern interferometry," Appl. Opt. 15, 2701-2704 (1976)

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  1. C. C. Aleksoff, in Holographic Nondestructive Testing, R. K. Erf, Ed. (Academic, New York, 1974), Chap. 8.3, p. 247. [CrossRef]
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  3. J. A. Levitt, K. A. Stetson, Appl. Opt. 15, 195 (1976). [CrossRef] [PubMed]
  4. N. Takai, M. Yamada, T. Idogawa, Opt. Laser Technol. 8, 21 (1976). [CrossRef]
  5. O. J. L⊘kberg, K. H⊘gmoen, J. Phys. E 9, 847 (1976). [CrossRef]
  6. H. M. Pedersen, O. J. L⊘kberg, B. M. F⊘rre, Opt. Commun. 12, 421 (1974). [CrossRef]

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