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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 15, Iss. 11 — Nov. 1, 1976
  • pp: 2730–2735

Lummer-Gehrcke interferometer modified for the spectroscopy of thin dielectric films

Cardinal Warde  »View Author Affiliations


Applied Optics, Vol. 15, Issue 11, pp. 2730-2735 (1976)
http://dx.doi.org/10.1364/AO.15.002730


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Abstract

The obsolete Lummer-Gehrcke interferometer is reexamined, and it is shown how, with a few simple modifications, this instrument can be used to study the optical properties of thin, solid, dielectric films. In particular, the thickness, the wavelength dispersion, and the absorption spectrum of the film can all be obtained simultaneously. In the case of anisotropic films, the polarization dependence of these parameters is obtained very conveniently. The modified interferometer allows continuous monitoring of the above parameters in situ during growth.

© 1976 Optical Society of America

History
Original Manuscript: March 13, 1976
Published: November 1, 1976

Citation
Cardinal Warde, "Lummer-Gehrcke interferometer modified for the spectroscopy of thin dielectric films," Appl. Opt. 15, 2730-2735 (1976)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-15-11-2730

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