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Applied Optics

Applied Optics


  • Vol. 15, Iss. 11 — Nov. 1, 1976
  • pp: 2730–2735

Lummer-Gehrcke interferometer modified for the spectroscopy of thin dielectric films

Cardinal Warde  »View Author Affiliations

Applied Optics, Vol. 15, Issue 11, pp. 2730-2735 (1976)

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The obsolete Lummer-Gehrcke interferometer is reexamined, and it is shown how, with a few simple modifications, this instrument can be used to study the optical properties of thin, solid, dielectric films. In particular, the thickness, the wavelength dispersion, and the absorption spectrum of the film can all be obtained simultaneously. In the case of anisotropic films, the polarization dependence of these parameters is obtained very conveniently. The modified interferometer allows continuous monitoring of the above parameters in situ during growth.

© 1976 Optical Society of America

Original Manuscript: March 13, 1976
Published: November 1, 1976

Cardinal Warde, "Lummer-Gehrcke interferometer modified for the spectroscopy of thin dielectric films," Appl. Opt. 15, 2730-2735 (1976)

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  1. O. Lummer, Verh. Dtsch. Phys. Ges. 3, 85 (1901).
  2. O. Lummer, E. Gehrcke, Ann. Phys. 10, (3) (1903), 457. [CrossRef]
  3. C. Candler, Modern Interferometers (Hilger and Watts, Ltd, London, 1951), pp. 321–344.
  4. M. Born, E. Wolf, Principles of Optics (Pergamon, London, 1975).
  5. N. J. Harrick, Internal Reflection Spectroscopy (Interscience, New York, 1967).
  6. J. M. Zimam, Principles of the Theory of Solids (Cambridge U. P., London, 1964), p. 229.
  7. H. E. Bennett, J. M. Bennett, Phys. Thin Films 4, 1 (1967).
  8. Cement used was UV-71 obtained from Summers Laboratories, Fort Washington, Pa.

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