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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 15, Iss. 12 — Dec. 1, 1976
  • pp: 2974–2976

Subtle source of contamination in spectrophones

J. C. Peterson, R. J. Nordstrom, and R. K. Long  »View Author Affiliations


Applied Optics, Vol. 15, Issue 12, pp. 2974-2976 (1976)
http://dx.doi.org/10.1364/AO.15.002974


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No abstract available.

History
Original Manuscript: September 4, 1976
Published: December 1, 1976

Citation
J. C. Peterson, R. J. Nordstrom, and R. K. Long, "Subtle source of contamination in spectrophones," Appl. Opt. 15, 2974-2976 (1976)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-15-12-2974


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References

  1. E. L. Kerr, J. G. Atwood, Appl. Opt 7, 915 (1968). [CrossRef] [PubMed]
  2. A. G. Bell, Proc. Am. Assoc. Advance Sci. 29, 115 (1880).
  3. A. G. Bell, Philos. Mag. 11, 510 (1881).
  4. T. F. Deaton, D. A. Depatie, T. W. Walker, Appl. Phys. Lett. 26, 300 (1975). [CrossRef]
  5. J. C. Peterson, “A Differential Spectrophone of Unique Design,” thesis, Ohio State U., (1976).
  6. E. K. Damon, F. S. Mills, J. C. Peterson, R. K. Long, “Spectrophone Measurement of the Water Vapor Continuum at DF Laser Frequencies,” Interim Technical Report RADC-TR-75-203 (August1975).
  7. G. L. Trusty, “Absorption Measurements of the 10.4 Micron Region Using a CO2 Laser and a Spectrophone,” Report 2819-4, Air Force Avionics Laboratory, AFAL-TR-72-413 (January1973).
  8. J. H. McCoy, D. B. Rensch, R. K. Long, Appl. Opt. 8, 1471 (1969). [CrossRef] [PubMed]
  9. D. E. Burch, “Semi-Annual Technical Report,” Aeronutronic Publication No. U-4784, Air Force Cambridge Research Laboratories, Contract F 19628-69-C-0263 (January1970).

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