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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 15, Iss. 12 — Dec. 1, 1976
  • pp: 3105–3110

Performance of a silicon vidicon at low signal levels

Donald M. Hunten and C. J. Stump, Jr.  »View Author Affiliations


Applied Optics, Vol. 15, Issue 12, pp. 3105-3110 (1976)
http://dx.doi.org/10.1364/AO.15.003105


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Abstract

An integrating camera based on a cooled silicon vidicon detector is briefly described. A treatment is given of the capacitive lag which limits the performance for small signals. The remedy is to alter the cathode voltage after erase to place a pedestal of about 105 electrons/pixel under the signal. Test results indicate that the background noise level cannot be reduced below 600 electrons/pixel in a processed frame, and values may approach 1000. Despite these limitations, the vidicon is found to be a useful and sensitive detector.

© 1976 Optical Society of America

History
Original Manuscript: June 14, 1976
Published: December 1, 1976

Citation
Donald M. Hunten and C. J. Stump, "Performance of a silicon vidicon at low signal levels," Appl. Opt. 15, 3105-3110 (1976)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-15-12-3105


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