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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 15, Iss. 12 — Dec. 1, 1976
  • pp: 3179–3184

In process ellipsometer azimuth angle calibration

J. R. Adams and N. M. Bashara  »View Author Affiliations


Applied Optics, Vol. 15, Issue 12, pp. 3179-3184 (1976)
http://dx.doi.org/10.1364/AO.15.003179


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Abstract

Two methods are described which provide in-process calibration of ellipsometer divided circles. Both methods (a residual method and a nonlinear least-squares estimation procedure) utilize multiple measurements on any arbitrary specimen to compute the azimuth angle corrections for the polarizer, compensator, and analyzer divided circles. The results of an experimental comparison of the two methods show (1) the confidence limits on the calibration constants are greater than is generally assumed, (2) that within experimental uncertainties both methods yield the same set of calibration constants, but one method may be more appropriate than the other for a given set of data, (3) the calibration constants can be a function of the wavelength of the light used for measurements, (4) other factors being equal, the maximum accuracy in a conventional ellipsometer system would be obtained by using a fixed-polarizer nulling scheme with the compensator set after reflection.

© 1976 Optical Society of America

History
Original Manuscript: January 15, 1975
Revised Manuscript: August 24, 1976
Published: December 1, 1976

Citation
J. R. Adams and N. M. Bashara, "In process ellipsometer azimuth angle calibration," Appl. Opt. 15, 3179-3184 (1976)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-15-12-3179


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