Abstract

This paper analyzes the effects of random surface irregularities on the intensity distribution of a Lummer-Gehrcke plate interferometer. These surface defects are distributed asymmetrically about the plane of the L-G plate and are usually caused by scratches during its use. Calculations have been conducted for typical values of parameters, and results of some specific examples have been presented graphically.

© 1976 Optical Society of America

Lummer-Gehrcke interferometer modified for the spectroscopy of thin dielectric films

Cardinal Warde
Appl. Opt. 15(11) 2730-2735 (1976)

Phase function and intensity distribution of a Lummer-Gehrcke multiinterferometer

Eusebio Bernabeu and Luis L. Sanchez-Soto
Appl. Opt. 25(18) 3163-3166 (1986)

Measurements with a Lummer Gehrcke Plate

John K. Robertson
J. Opt. Soc. Am. 11(5) 559-563 (1925)

Sparrow Limit of Spectral Resolution in the Reflection Echelon and the Fabry-Perot Interferometer Having Surface Imperfections

K. Singh and G. S. Bhatnagar
Appl. Opt. 9(10) 2326-2331 (1970)

Fringe broadening in Fabry-Perot interferometers

G. J. Sloggett
Appl. Opt. 23(14) 2427-2432 (1984)