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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 16, Iss. 11 — Nov. 1, 1977
  • pp: 2827–2833

Measurement techniques for small absorption coefficients: recent advances

A. Hordvik  »View Author Affiliations


Applied Optics, Vol. 16, Issue 11, pp. 2827-2833 (1977)
http://dx.doi.org/10.1364/AO.16.002827


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Abstract

A review is given of several newly developed methods for measuring low absorption losses in optical materials. Transmission, emittance, and calorimetric techniques are described with special emphasis on how thermocouple and photoacoustic calorimetry can be used to determine both bulk and surface absorption simultaneously. The advantages and disadvantages of the various approaches are discussed, and estimates are given of the sensitivities that can be achieved with the different techniques. Finally, a new ac interferometric calorimetric method for measuring low bulk losses is proposed.

© 1977 Optical Society of America

History
Original Manuscript: January 1, 1977
Published: November 1, 1977

Citation
A. Hordvik, "Measurement techniques for small absorption coefficients: recent advances," Appl. Opt. 16, 2827-2833 (1977)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-16-11-2827


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References

  1. L. Skolnik, in Optical Properties of Highly Transparent Solids, S. S. Mitra, B. Bendow, Eds. (Plenum, New York, 1975), p. 405. [CrossRef]
  2. T. F. Deutsch, J. Phys. Chem. Solids 34, 2091 (1973). [CrossRef]
  3. N. J. Harrick, Internal Reflection Spectroscopy (Interscience, New York, 1967).
  4. S. N. Jasperson, D. K. Burge, R. C. O’Handley, Surf. Sci. 37, 548 (1973). [CrossRef]
  5. A. Otto, Z. Phys. 216, 398 (1968). [CrossRef]
  6. E. Kretschmann, Z. Phys. 241, 313 (1971). [CrossRef]
  7. H. P. Weber, F. A. Dunn, Appl. Opt. 12, 755 (1973). [CrossRef] [PubMed]
  8. D. Krause, in Optical Properties of Highly Transparent Solids, S. S. Mitra, B. Bendow, Eds. (Plenum, New York, 1975), p. 483. [CrossRef]
  9. W. Heitmann, Appl. Opt. 14, 3047 (1975); Appl. Opt. 15, 256 (1976). [CrossRef] [PubMed]
  10. M. K. Barnoski, S. M. Jensen, Appl. Opt. 15, 2112 (1976). [CrossRef] [PubMed]
  11. A. Hjortsberg, W. P. Chen, E. Burstein, in Digest of Technical Meeting on Optical Phenomena in Infrared Materials (Optical Society of America, Washington, D.C., 1976).
  12. R. T. Holm, E. D. Palik, J. W. Gibson, in Ref. 11.
  13. W. P. Chen, A. Hjortsberg, E. Burstein, in Ref. 11.
  14. G. A. Haas, T. Pankey, R. T. Holm, J. Appl. Phys. 47, 1185 (1976). [CrossRef]
  15. R. T. Holm, E. D. Palik, in Laser Induced Damage in Optical Materials: 1976, A. J. Glass, A. H. Guenther, Eds., NBS Special Publication 462 (Govt. Printing Office, Wash. D.C., 1976), p. 246.
  16. T. Tamir, A. A. Oliner, J. Opt. Soc. Am. 59, 942 (1969).
  17. O. S. Heavens, S. K. Sharma, Opt. Commun. 17, 339 (1976). [CrossRef]
  18. D. L. Stierwalt, T. B. Bernstein, D. D. Kirk, Appl. Opt. 2, 1169 (1963). [CrossRef]
  19. D. L. Stierwalt, Appl. Opt. 5, 1911 (1966). [CrossRef] [PubMed]
  20. L. H. Skolnik, “Spectral Emittance Measurements on Some Laser Window Materials,” AFCRL-TR-74-0590 (1974).
  21. D. L. Stierwalt, in Laser Induced Damage in Optical Materials: 1975, A. J. Glass, A. H. Guenther, Eds. NBS Special Publication 435 (1976), p. 148.
  22. L. Hobrock, Hughes Aircraft; private communication.
  23. L. Skolnik, A. Kahan, Rome Air Development Center; private communication.
  24. P. Morse, J. R. Engel, “Cryogenic Emittance Spectrometer,” RADC-TR-76-126 (1976).
  25. J. H. Parks, D. A. Rockwell, T. S. Colbert, K. M. Lakin, D. Mih, Appl. Phys. Lett. 25, 537 (1974). [CrossRef]
  26. D. A. Rockwell, J. H. Parks, J. Appl. Phys. 47, 4213 (1976). [CrossRef]
  27. D. A. Pinnow, T. C. Rich, Appl. Opt. 12, 984 (1973). [CrossRef] [PubMed]
  28. M. Hass, J. W. Davisson, H. B. Rosenstock, J. Babiskin, Appl. Opt. 14, 1128 (1975). [CrossRef] [PubMed]
  29. E. Bernal G, Appl. Opt. 14, 314 (1975). [CrossRef] [PubMed]
  30. K. I. White, J. E. Midwinter, Opto-Electronics 5, 323 (1973); in Optical Properties of Highly Transparent Solids, S. S. Mitra, B. Bendow, Eds. (Plenum, New York, 1975), p. 461. [CrossRef]
  31. K. I. White, Opt. Quant. Elect. 8, 73 (1976). [CrossRef]
  32. T. F. Deutsch, J. Electron. Mater. 4, 663 (1975). [CrossRef]
  33. H. B. Rosenstock, D. A. Gregory, J. A. Harrington, Appl. Opt. 15, 2075 (1976). [CrossRef] [PubMed]
  34. H. B. Rosenstock, M. Hass, D. A. Gregory, J. A. Harrington, Appl. Opt. 16, 2837 (1977). [CrossRef] [PubMed]
  35. J. A. Harrington, M. Braunstein, J. E. Rudisill, Appl. Opt. 16, 2893 (1977). [CrossRef]
  36. J. S. Loomis, Appl. Opt. 12, 877 (1973). [CrossRef] [PubMed]
  37. W. E. K. Gibbs, A. W. Butterfield, Appl. Opt. 14, 3043 (1975). [CrossRef] [PubMed]
  38. M. Sparks, in Ref. 15, p. 203.
  39. A. G. Bell, Am. J. Sci. 20, 305 (1880); Philos. Mag. 11, 510 (1881).
  40. L. K. Kreuzer, J. Appl. Phys. 42, 2934 (1971). [CrossRef]
  41. A. Rosencwaig, Opt. Commun. 7, 305 (1973); Phys. Today 28 (9), 23 (1975). [CrossRef]
  42. A. Rosencwaig, A. Gersho, J. Appl. Phys. 47, 64 (1976). [CrossRef]
  43. E. L. Kerr, Appl. Opt. 12, 2520 (1973). [CrossRef] [PubMed]
  44. J. G. Parker, Appl. Opt. 12, 2974 (1973). [CrossRef] [PubMed]
  45. H. S. Bennett, R. A. Forman, Appl. Opt. 14, 3031 (1975); Appl. Opt. 15, 347, 1313, 2405 (1976). [CrossRef] [PubMed]
  46. A. Hordvik, H. Schlossberg, J. Opt. Soc. Am. 65, 1165 (1975); Appl. Opt. 16, 101 (1977). [PubMed]
  47. A. Hordvik, J. Opt. Soc. Am. 66, 1105 (1976).
  48. H. S. Bennett, R. A. Forman, in Digest of Topical Meeting on Optical Phenomena in Infrared Materials, (Optical Society of America, Washington, D.C., 1976).
  49. A. Hordvik, L. Skolnik, Appl. Opt. 16, 2919 (1977). [CrossRef] [PubMed]
  50. A. Hordvik, L. Skolnik in Proceedings of the AFSC 1972 Science and Engineering Symposium, San Antonio, Texas. AFSC Publication AFSC-TR-72-005 (U.S. Government Printing Office, Washington, D.C., 1972), Vol. 2.
  51. L. Skolnik, A. Hordvik, A. Kahan, Appl. Phys. Lett. 23, 477 (1973). [CrossRef]
  52. E. Bernal G, Honeywell Corporate Research Center; private communication.

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