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Applied Optics

Applied Optics


  • Vol. 16, Iss. 11 — Nov. 1, 1977
  • pp: 2849–2857

Refractive indices of ir materials: 10.6-μm ellipsometer measurements

M. E. Pedinoff, M. Braunstein, and O. M. Stafsudd  »View Author Affiliations

Applied Optics, Vol. 16, Issue 11, pp. 2849-2857 (1977)

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10.6-μm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive indices of KCl, CdTe, and ZnSe crystals and for ZnSe and ThF4 films.

© 1977 Optical Society of America

Original Manuscript: January 12, 1977
Published: November 1, 1977

M. E. Pedinoff, M. Braunstein, and O. M. Stafsudd, "Refractive indices of ir materials: 10.6-μm ellipsometer measurements," Appl. Opt. 16, 2849-2857 (1977)

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