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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 16, Iss. 11 — Nov. 1, 1977
  • pp: 2849–2857

Refractive indices of ir materials: 10.6-μm ellipsometer measurements

M. E. Pedinoff, M. Braunstein, and O. M. Stafsudd  »View Author Affiliations


Applied Optics, Vol. 16, Issue 11, pp. 2849-2857 (1977)
http://dx.doi.org/10.1364/AO.16.002849


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Abstract

10.6-μm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive indices of KCl, CdTe, and ZnSe crystals and for ZnSe and ThF4 films.

© 1977 Optical Society of America

History
Original Manuscript: January 12, 1977
Published: November 1, 1977

Citation
M. E. Pedinoff, M. Braunstein, and O. M. Stafsudd, "Refractive indices of ir materials: 10.6-μm ellipsometer measurements," Appl. Opt. 16, 2849-2857 (1977)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-16-11-2849


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References

  1. S. D. Allen, A. I. Braunstein, M. Braunstein, J. C. Cheng, L. A. Nafie, “A 10.6 Micron Modulated Light Ellipsometer,” in Optical Properties of Highly Transparent Solids, S. S. Mitra, B. Bendow, Eds. (Plenum, New York, 1975), pp. 503–513. [CrossRef]
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