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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 16, Iss. 8 — Aug. 1, 1977
  • pp: 2147–2151

Loss mechanisms in dielectric optical interference devices

Oded Arnon  »View Author Affiliations


Applied Optics, Vol. 16, Issue 8, pp. 2147-2151 (1977)
http://dx.doi.org/10.1364/AO.16.002147


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Abstract

Residual absorption and scattering are loss mechanisms that degrade the performance of all thin films optical devices. By analogy to residual absorption, expressions are derived to evaluate losses due to surface and bulk scattering in dielectric multilayers. Based on these, proposals are made to improve the traditional performances of some basic filters. It is shown how, by means of index inhomogeneity, surface scattering is expected to be reduced considerably.

© 1977 Optical Society of America

History
Original Manuscript: December 31, 1976
Published: August 1, 1977

Citation
Oded Arnon, "Loss mechanisms in dielectric optical interference devices," Appl. Opt. 16, 2147-2151 (1977)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-16-8-2147

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