A method of profile control or measurement using projected fringes is presented. The fringes are dynamically translated over the object, and the phase of the signal picked up at a selected point on the surface is used to determine the depth or the depth error of the profile at this point. The method has the advantage of being contact-free, fast, accurate, and easily automated.
© 1978 Optical Society of America
Original Manuscript: December 12, 1977
Published: September 15, 1978
G. Indebetouw, "Profile measurement using projection of running fringes," Appl. Opt. 17, 2930-2933 (1978)