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Applied Optics

Applied Optics


  • Vol. 17, Iss. 19 — Oct. 1, 1978
  • pp: 3019–3021

Narrow resonance structure in the Mie scattering characteristics

Petr Chýlek, J. T. Kiehl, and M. K. W. Ko  »View Author Affiliations

Applied Optics, Vol. 17, Issue 19, pp. 3019-3021 (1978)

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No abstract available.

Original Manuscript: July 26, 1978
Published: October 1, 1978

Petr Chýlek, J. T. Kiehl, and M. K. W. Ko, "Narrow resonance structure in the Mie scattering characteristics," Appl. Opt. 17, 3019-3021 (1978)

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  1. W. M. Irvine, J. Opt. Soc. Am. 55, 16 (1965). [CrossRef]
  2. S. T. Shipley, J. A. Weinman, J. Opt. Soc. Am. 68, 130 (1978). [CrossRef]
  3. H. C. Bryant, A. J. Cox, J. Opt. Soc. Am. 56, 1529 (1966). [CrossRef]
  4. P. Chýlek, J. Opt. Soc. Am. 66, 285 (1976). [CrossRef]
  5. P. Chýlek, G. W. Grams, R. J. Pinnick, Science 193, 480 (1976). [CrossRef]
  6. A. Ashkin, J. M. Dziedzic, Phys. Rev. Lett. 38, 1351 (1977). [CrossRef]
  7. P. Chýlek, J. Kiehl, M. Ko, Phys. Rev. A, in press.

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