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Applied Optics

Applied Optics


  • Vol. 17, Iss. 22 — Nov. 15, 1978
  • pp: 3529–3530

Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities

D. M. Trotter, Jr. and E. A. Schiff  »View Author Affiliations

Applied Optics, Vol. 17, Issue 22, pp. 3529-3530 (1978)

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No abstract available.

Original Manuscript: August 31, 1978
Published: November 15, 1978

D. M. Trotter and E. A. Schiff, "Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities," Appl. Opt. 17, 3529-3530 (1978)

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  1. P. R. Griffiths, Chemical Fourier Transform Spectroscopy (Wiley, New York, 1975), pp. 10, 110, 172.
  2. Ref. 1, p. 123.
  3. W. H. Steel, Interferometry (Cambridge U. P., London, 1967), p. 57.
  4. R. J. Bell, Introductory Fourier Transform Spectroscopy (Academic, New York, 1972), p. 142ff.

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