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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 22 — Nov. 15, 1978
  • pp: 3529–3530

Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities

D. M. Trotter and E. A. Schiff  »View Author Affiliations


Applied Optics, Vol. 17, Issue 22, pp. 3529-3530 (1978)
http://dx.doi.org/10.1364/AO.17.003529


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No abstract available.

History
Original Manuscript: August 31, 1978
Published: November 15, 1978

Citation
D. M. Trotter and E. A. Schiff, "Alignment of a Fourier transform spectrometer for measuring high temperature reflectivities," Appl. Opt. 17, 3529-3530 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-22-3529

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