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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 22 — Nov. 15, 1978
  • pp: 3541–3546

Low-background large-aperture infrared measurement facility: design considerations

Rudolf H. Meier and Alan B. Dauger  »View Author Affiliations


Applied Optics, Vol. 17, Issue 22, pp. 3541-3546 (1978)
http://dx.doi.org/10.1364/AO.17.003541


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Abstract

Design features of a measurement facility for the prelaunch evaluation of ir space sensors are described. After a listing of the facility’s major capabilities, an analysis of its internal calibration process is given. This is followed by a discussion of test beam characteristics and some performance limitations. Concepts for improvements are presented.

© 1978 Optical Society of America

History
Original Manuscript: October 14, 1977
Published: November 15, 1978

Citation
Rudolf H. Meier and Alan B. Dauger, "Low-background large-aperture infrared measurement facility: design considerations," Appl. Opt. 17, 3541-3546 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-22-3541

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