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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 22 — Nov. 15, 1978
  • pp: 3647–3652

Optical fiber refractometry by interference microscopy: a simplified method

J. Stone and H. E. Earl  »View Author Affiliations


Applied Optics, Vol. 17, Issue 22, pp. 3647-3652 (1978)
http://dx.doi.org/10.1364/AO.17.003647


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Abstract

Index of refraction profiles of optical fibers are obtained by a new interference technique closely related to Mach-Zehnder microscope interferometry. Data are obtained from specially prepared samples using a conventional reflected light microscope. Excellent agreement is obtained with the results using the Mach-Zehnder method but at a considerable reduction in the cost and complexity of instrumentation.

© 1978 Optical Society of America

History
Original Manuscript: May 30, 1978
Published: November 15, 1978

Citation
J. Stone and H. E. Earl, "Optical fiber refractometry by interference microscopy: a simplified method," Appl. Opt. 17, 3647-3652 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-22-3647

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