Weakly absorbing layers: interferometric determination of their optical parameters
Applied Optics, Vol. 17, Issue 23, pp. 3738-3745 (1978)
http://dx.doi.org/10.1364/AO.17.003738
Acrobat PDF (793 KB)
Abstract
The determination of the absorption of very weakly absorbing thin films and film systems is a difficult problem. In the present work a previously suggested method is generalized and improved in order to apply it for the determination of the absorption of films and multilayers. In the case of single layers, a single measurement is adequate to determine also the thickness and refractive index of the film. The main advantages of the method described here are its simplicity, its self-calibrating nature, and its high sensitivity to absorption.
© 1978 Optical Society of America
Citation
Y. Demner and J. Shamir, "Weakly absorbing layers: interferometric determination of their optical parameters," Appl. Opt. 17, 3738-3745 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-23-3738
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 