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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 23 — Dec. 1, 1978
  • pp: 3738–3745

Weakly absorbing layers: interferometric determination of their optical parameters

Y. Demner and J. Shamir  »View Author Affiliations


Applied Optics, Vol. 17, Issue 23, pp. 3738-3745 (1978)
http://dx.doi.org/10.1364/AO.17.003738


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Abstract

The determination of the absorption of very weakly absorbing thin films and film systems is a difficult problem. In the present work a previously suggested method is generalized and improved in order to apply it for the determination of the absorption of films and multilayers. In the case of single layers, a single measurement is adequate to determine also the thickness and refractive index of the film. The main advantages of the method described here are its simplicity, its self-calibrating nature, and its high sensitivity to absorption.

© 1978 Optical Society of America

History
Original Manuscript: February 14, 1978
Published: December 1, 1978

Citation
Y. Demner and J. Shamir, "Weakly absorbing layers: interferometric determination of their optical parameters," Appl. Opt. 17, 3738-3745 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-23-3738

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