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Applied Optics

Applied Optics


  • Vol. 17, Iss. 23 — Dec. 1, 1978
  • pp: 3738–3745

Weakly absorbing layers: interferometric determination of their optical parameters

Y. Demner and J. Shamir  »View Author Affiliations

Applied Optics, Vol. 17, Issue 23, pp. 3738-3745 (1978)

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The determination of the absorption of very weakly absorbing thin films and film systems is a difficult problem. In the present work a previously suggested method is generalized and improved in order to apply it for the determination of the absorption of films and multilayers. In the case of single layers, a single measurement is adequate to determine also the thickness and refractive index of the film. The main advantages of the method described here are its simplicity, its self-calibrating nature, and its high sensitivity to absorption.

© 1978 Optical Society of America

Original Manuscript: February 14, 1978
Published: December 1, 1978

Y. Demner and J. Shamir, "Weakly absorbing layers: interferometric determination of their optical parameters," Appl. Opt. 17, 3738-3745 (1978)

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  1. K. Kinosita, M. Yamamoto, Thin Solid Films 34, 283 (1976). [CrossRef]
  2. R. A. Hoffman, Appl. Opt. 13, 1405 (1974). [CrossRef] [PubMed]
  3. H. Ahrens, H. Welling, H. E. Scheel, Appl. Phys. 1, 69 (1973). [CrossRef]
  4. V. Sanders, Appl. Opt. 16, 19 (1977). [CrossRef] [PubMed]
  5. J. Shamir, P. Gräff, Appl. Opt. 14, 3053 (1975). [CrossRef] [PubMed]
  6. J. Shamir, Appl. Opt. 15, 120 (1976). [CrossRef] [PubMed]
  7. M. Born, E. Wolf, Principles of Optics (Pergamon, London, 1975), pp. 51–70, 611–634.
  8. J. Shamir, R. Fox, Am. J. Phys. 35, 161 (1967). [CrossRef]
  9. J. Shamir, Am. J. Phys. 45, 1118 (1977). [CrossRef]

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