The determination of the absorption of very weakly absorbing thin films and film systems is a difficult problem. In the present work a previously suggested method is generalized and improved in order to apply it for the determination of the absorption of films and multilayers. In the case of single layers, a single measurement is adequate to determine also the thickness and refractive index of the film. The main advantages of the method described here are its simplicity, its self-calibrating nature, and its high sensitivity to absorption.
© 1978 Optical Society of America
Original Manuscript: February 14, 1978
Published: December 1, 1978
Y. Demner and J. Shamir, "Weakly absorbing layers: interferometric determination of their optical parameters," Appl. Opt. 17, 3738-3745 (1978)