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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 4 — Feb. 15, 1978
  • pp: 538–541

Fast computation method for derivatives of multilayer stack reflectance

C. J. v. d. Laan and H. J. Frankena  »View Author Affiliations


Applied Optics, Vol. 17, Issue 4, pp. 538-541 (1978)
http://dx.doi.org/10.1364/AO.17.000538


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Abstract

An analytical procedure for the calculation of the derivatives of the reflectance R of a dielectric multilayer stack is presented. Considered are the derivatives (∂R/∂nk)d, (∂R/∂nk)D, (∂R/∂dk)n, and (∂R/∂Dk)n, nk, dk, and Dk being the refractive index, the thickness, and the effective optical thickness of the kth layer, respectively. These calculations lead to a computational algorithm which, as compared with the method using finite difference approximation, reduces the computer time by a factor of f (the total number of layers).

© 1978 Optical Society of America

History
Original Manuscript: July 18, 1977
Published: February 15, 1978

Citation
C. J. v. d. Laan and H. J. Frankena, "Fast computation method for derivatives of multilayer stack reflectance," Appl. Opt. 17, 538-541 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-4-538

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