A detailed experimental and theoretical study of narrow ridge waveguides in glass films formed by ion-etching of patterns in photoresist has been carried out. Because the resultant waveguide profiles are trapezoidal a numerical approach, the finite-element method, has been used to compute theoretical dispersion curves. Experimental dispersion curves were obtained from measurements of output m-lines. Agreement between experiment and theory varies from moderately good to excellent over the range of waveguide profiles studied.
© 1978 Optical Society of America
Original Manuscript: May 20, 1977
Published: April 15, 1978
P. M. Pelosi, P. Vandenbulcke, C. D. W. Wilkinson, and R. M. De La Rue, "Propagation characteristics of trapezoidal cross-section ridge optical waveguides: an experimental and theoretical investigation," Appl. Opt. 17, 1187-1193 (1978)