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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 17, Iss. 8 — Apr. 15, 1978
  • pp: 1187–1193

Propagation characteristics of trapezoidal cross-section ridge optical waveguides: an experimental and theoretical investigation

P. M. Pelosi, P. Vandenbulcke, C. D. W. Wilkinson, and R. M. De La Rue  »View Author Affiliations


Applied Optics, Vol. 17, Issue 8, pp. 1187-1193 (1978)
http://dx.doi.org/10.1364/AO.17.001187


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Abstract

A detailed experimental and theoretical study of narrow ridge waveguides in glass films formed by ion-etching of patterns in photoresist has been carried out. Because the resultant waveguide profiles are trapezoidal a numerical approach, the finite-element method, has been used to compute theoretical dispersion curves. Experimental dispersion curves were obtained from measurements of output m-lines. Agreement between experiment and theory varies from moderately good to excellent over the range of waveguide profiles studied.

© 1978 Optical Society of America

History
Original Manuscript: May 20, 1977
Published: April 15, 1978

Citation
P. M. Pelosi, P. Vandenbulcke, C. D. W. Wilkinson, and R. M. De La Rue, "Propagation characteristics of trapezoidal cross-section ridge optical waveguides: an experimental and theoretical investigation," Appl. Opt. 17, 1187-1193 (1978)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-17-8-1187

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