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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 18, Iss. 6 — Mar. 15, 1979
  • pp: 809–812

Measurement of the polarization effects of an instrument using partially polarized light

Barton J. Howell  »View Author Affiliations


Applied Optics, Vol. 18, Issue 6, pp. 809-812 (1979)
http://dx.doi.org/10.1364/AO.18.000809


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Abstract

Accuracy of a radiometer is adversely affected by scene polarization if the receiving optical system is sensitive to polarization. It is therefore necessary to specify and measure the sensitivity of the system to polarized light. The Mueller-Stokes matrix of an instrument may be determined experimentally and used to predict the effects of the instrument on any beam. The specification of a maximum polarization sensitivity stated in terms of the degree of polarization produced in an unpolarized beam can be experimentally verified even though an unpolarized beam is not available in the laboratory for direct measurement.

© 1979 Optical Society of America

History
Original Manuscript: June 1, 1978
Published: March 15, 1979

Citation
Barton J. Howell, "Measurement of the polarization effects of an instrument using partially polarized light," Appl. Opt. 18, 809-812 (1979)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-18-6-809

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