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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 19, Iss. 10 — May. 15, 1980
  • pp: 1694–1696

Infrared optical properties of silicon monoxide films

A. Hjortsberg and C. G. Granqvist  »View Author Affiliations


Applied Optics, Vol. 19, Issue 10, pp. 1694-1696 (1980)
http://dx.doi.org/10.1364/AO.19.001694


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Abstract

The dielectric function εε1 + 2 of evaporated SiO films is reported for the wavelength region from 8 to 33 μm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for ε and ε2 is verified by the Kramers-Kronig analysis.

© 1980 Optical Society of America

History
Original Manuscript: December 15, 1979
Published: May 15, 1980

Citation
A. Hjortsberg and C. G. Granqvist, "Infrared optical properties of silicon monoxide films," Appl. Opt. 19, 1694-1696 (1980)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-19-10-1694

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