Abstract

The dielectric function ε ≡ ε₁ + iε₂ of evaporated SiO films is reported for the wavelength region from 8 to 33 μm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for ε and ε₂ is verified by the Kramers-Kronig analysis.

© 1980 Optical Society of America

Infrared optical properties of evaporated alumina films

T. S. Eriksson, A. Hjortsberg, G. A. Niklasson, and C. G. Granqvist
Appl. Opt. 20(15) 2742-2746 (1981)

Infrared optical properties of electron-beam evaporated silicon oxynitride films

T. S. Eriksson and C. G. Granqvist
Appl. Opt. 22(20) 3204-3206 (1983)

Optical Properties of Silicon Monoxide in the Wavelength Region from 0.24 to 14.0 Microns*

Georg Hass and Calvin D. Salzberg
J. Opt. Soc. Am. 44(3) 181-187 (1954)

Solar Absorptivity and Thermal Emissivity of Aluminum Coated with Silicon Oxide Films Prepared by Evaporation of Silicon Monoxide

A. P. Bradford, G. Hass, J. B. Heaney, and J. J. Triolo
Appl. Opt. 9(2) 339-344 (1970)

Optical Properties of Evaporated Lead Monoxide Films

A. E. Ennos
J. Opt. Soc. Am. 52(3) 261-264 (1962)