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Applied Optics

Applied Optics


  • Vol. 19, Iss. 11 — Jun. 1, 1980
  • pp: 1735–1736

Ellipsometry data analysis aided by derivative plots in n,κ-space

A. J. Melmed and J. J. Carroll  »View Author Affiliations

Applied Optics, Vol. 19, Issue 11, pp. 1735-1736 (1980)

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No abstract available.

Original Manuscript: December 3, 1979
Published: June 1, 1980

A. J. Melmed and J. J. Carroll, "Ellipsometry data analysis aided by derivative plots in n,κ-space," Appl. Opt. 19, 1735-1736 (1980)

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  1. J. J. Carroll, T. E. Madey, A. J. Melmed, D. R. Saridstrom, in Proceedings of the Fourth International Conference on Ellipsometry to be published in Surf. Sci., 96, August (1980).
  2. J. J. Carroll, A. J. Melmed, Surf. Sci. 16, 251 (1969). [CrossRef]
  3. A. J. Melmed, J. J. Carroll, J. Vac. Sci. Technol. 10, 164 (1973). [CrossRef]
  4. F. L. McCrackin, “A Fortran Program for Analysis of Ellipsometer Measurements,” Natl. Bur. Stand. U.S. Tech. Note 479 (1969).
  5. Modifications of the computer program, Ref. 4, made by F. L. McCrackin.

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