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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 19, Iss. 11 — Jun. 1, 1980
  • pp: 1735–1736

Ellipsometry data analysis aided by derivative plots in n,κ-space

A. J. Melmed and J. J. Carroll  »View Author Affiliations


Applied Optics, Vol. 19, Issue 11, pp. 1735-1736 (1980)
http://dx.doi.org/10.1364/AO.19.001735


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No abstract available.

History
Original Manuscript: December 3, 1979
Published: June 1, 1980

Citation
A. J. Melmed and J. J. Carroll, "Ellipsometry data analysis aided by derivative plots in n,κ-space," Appl. Opt. 19, 1735-1736 (1980)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-19-11-1735


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References

  1. J. J. Carroll, T. E. Madey, A. J. Melmed, D. R. Saridstrom, in Proceedings of the Fourth International Conference on Ellipsometry to be published in Surf. Sci., 96, August (1980).
  2. J. J. Carroll, A. J. Melmed, Surf. Sci. 16, 251 (1969). [CrossRef]
  3. A. J. Melmed, J. J. Carroll, J. Vac. Sci. Technol. 10, 164 (1973). [CrossRef]
  4. F. L. McCrackin, “A Fortran Program for Analysis of Ellipsometer Measurements,” Natl. Bur. Stand. U.S. Tech. Note 479 (1969).
  5. Modifications of the computer program, Ref. 4, made by F. L. McCrackin.

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