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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 19, Iss. 11 — Jun. 1, 1980
  • pp: 1853–1855

Electric field distribution and the reduction of laser damage in multilayers

O. Arnon and P. Baumeister  »View Author Affiliations


Applied Optics, Vol. 19, Issue 11, pp. 1853-1855 (1980)
http://dx.doi.org/10.1364/AO.19.001853


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Abstract

The characteristic matrix method is used to compute the electric field distribution in a multilayer. The use of optically inhomogeneous films is suggested to lessen discontinuity in the material properties and in the absorption distribution at interfaces between the high-index and the low-index layers, thereby enhancing the laser damage threshold.

© 1980 Optical Society of America

History
Original Manuscript: December 14, 1979
Published: June 1, 1980

Citation
O. Arnon and P. Baumeister, "Electric field distribution and the reduction of laser damage in multilayers," Appl. Opt. 19, 1853-1855 (1980)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-19-11-1853


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References

  1. B. Newnam, D. H. Gill, G. Faulkner, “Influence of Standing-Wave Fields on the Laser Damage Resistance of Dielectric Films,” Nat. Bur. Stand. U. S. Spec. Publ. 435 (1975), p. 254.
  2. J. H. Apfel, J. S. Mateucci, B. E. Newnam, D. H. Gill, “The Role of Electric Field Strength in Laser Damage of Dielectric Multilayers,” Nat. Bur. Stand. U.S. Spec. Publ. 462 (1976), p. 301.
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  4. D. H. Gill, B. E. Newnam, J. McLeod, “Use of Nonquarter-wave Designs to Increase the Damage Resistance of Reflectors at 532 and 1064 nanometer,” at NBS Ninth Symposium on Materials for High Power Lasers, Boulder, Colo., October 1977.
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  7. B. E. Newnam, D. H. Gill, G. Faulkner, “Influence of Standing Wave Fields on the Laser Damage Resistance of Dielectric Films,” Nat. Bur. Stand. U.S. Spec. Publ. 435 (1976).
  8. J. H. Apfel, Appl. Opt. 15, 2339 (1976). [CrossRef] [PubMed]
  9. R. Jacobsson, “Light Reflection from Films of Continuously Varying Refractive Index,” in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1966), Vol. 5. [CrossRef]
  10. F. Abelés, “Optics of Thin Films,” in Advanced Optical Techniques, A. C. S. Van Heel, Ed. (North-Holland, Amsterdam, 1967).
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  13. V. V. Veremei, I. M. Minkov, Opt. Spectrosc. 33, 640 (1972).
  14. W. Hansen, J. Opt. Soc. Am. 58, 380 (1968). [CrossRef]

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