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Applied Optics

Applied Optics


  • Vol. 19, Iss. 14 — Jul. 15, 1980
  • pp: 2419–2425

Scattering from high efficiency diffraction gratings

G. J. Dunning and M. L. Minden  »View Author Affiliations

Applied Optics, Vol. 19, Issue 14, pp. 2419-2425 (1980)

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This paper has characterized and measured scatter from high efficiency and reflective diffraction gratings. Three major types of scatter are identified: (1) random, which occurs over 2π sr; (2) band or ghost scatter, which occurs in the plane of incidence; and (3) structured scatter, which is a symmetrical pattern repeated about each order. Measurements were taken at 10.6 μm on gratings made by ruling, ion etching, holography, or a combination of these techniques. We found that the characteristic scatter from these high efficiency gratings depends strongly on the way the gratings are fabricated.

© 1980 Optical Society of America

Original Manuscript: February 19, 1980
Published: July 15, 1980

G. J. Dunning and M. L. Minden, "Scattering from high efficiency diffraction gratings," Appl. Opt. 19, 2419-2425 (1980)

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