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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 19, Iss. 14 — Jul. 15, 1980
  • pp: 2419–2425

Scattering from high efficiency diffraction gratings

G. J. Dunning and M. L. Minden  »View Author Affiliations


Applied Optics, Vol. 19, Issue 14, pp. 2419-2425 (1980)
http://dx.doi.org/10.1364/AO.19.002419


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Abstract

This paper has characterized and measured scatter from high efficiency and reflective diffraction gratings. Three major types of scatter are identified: (1) random, which occurs over 2π sr; (2) band or ghost scatter, which occurs in the plane of incidence; and (3) structured scatter, which is a symmetrical pattern repeated about each order. Measurements were taken at 10.6 μm on gratings made by ruling, ion etching, holography, or a combination of these techniques. We found that the characteristic scatter from these high efficiency gratings depends strongly on the way the gratings are fabricated.

© 1980 Optical Society of America

History
Original Manuscript: February 19, 1980
Published: July 15, 1980

Citation
G. J. Dunning and M. L. Minden, "Scattering from high efficiency diffraction gratings," Appl. Opt. 19, 2419-2425 (1980)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-19-14-2419

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