Abstract

A measurement technique is presented for determining simultaneously the refractive-index difference between a multilayered medium and the layer thickness. The technique is simple because it is based on measurement of the standard reflection characteristics of light. Use of this technique to measure the index difference between sputtered fused silica and Pyrex glass is described. The applicable range and advantages are also discussed.

© 1980 Optical Society of America

Refractive-index measurements of moderately reflecting substrates using a wedged film technique

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