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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 19, Iss. 2 — Jan. 15, 1980
  • pp: 184–184

In situ measurement of film index of refraction for the optical coating technician

W. E. Alston  »View Author Affiliations


Applied Optics, Vol. 19, Issue 2, pp. 184-184 (1980)
http://dx.doi.org/10.1364/AO.19.000184


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No abstract available.

History
Original Manuscript: October 12, 1979
Published: January 15, 1980

Citation
W. E. Alston, "In situ measurement of film index of refraction for the optical coating technician," Appl. Opt. 19, 184-184 (1980)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-19-2-184

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