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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 19, Iss. 2 — Jan. 15, 1980
  • pp: 201–206

Nonlinear optical processing with Fabry-Perot interferometers containing phase recording media

Bruce J. Bartholomew and Sing H. Lee  »View Author Affiliations


Applied Optics, Vol. 19, Issue 2, pp. 201-206 (1980)
http://dx.doi.org/10.1364/AO.19.000201


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Abstract

New techniques in nonlinear optical processing are explored, based on the operation of intensity level selection as performed by a Fabry-Perot interferometer containing a phase object. The image being processed is recorded on a medium between the mirrors as a spatially varying phase shift less than π. The interferometer only transmits light through those portions of the object that correspond to a single value of the phase and hence to a single intensity level in the input. More complicated operations such as thresholding and analog-to-digital conversion are performed by modulating the light source as the different levels are selected. Photoresist and lithium niobate have been used as phase objects, and experimental data for both are presented. Three kinds of Fabry-Perot interferometers have been used to demonstrate nonlinear processing using coherent and incoherent light. Color images have been produced with black and white inputs and white light illumination.

© 1980 Optical Society of America

History
Original Manuscript: May 21, 1979
Published: January 15, 1980

Citation
Bruce J. Bartholomew and Sing H. Lee, "Nonlinear optical processing with Fabry-Perot interferometers containing phase recording media," Appl. Opt. 19, 201-206 (1980)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-19-2-201


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References

  1. D. P. Jablonowski, S. H. Lee, Appl. Phys., 8, 51 (1975). [CrossRef]
  2. P. N. Tamura, J. C. Wyant, Proc. SPIE 74, 57 (1976). [CrossRef]
  3. S. H. Lee, B. J. Bartholomew, J. Cederquist, Proc. SPIE 83, 78 (1976). [CrossRef]
  4. R. A. Bartolini, Appl. Opt. 11, 1275 (1972). [CrossRef] [PubMed]
  5. J. Cederquist, S. H. Lee, in Proceedings, Electro-Optics/Laser Conference, Anaheim, Calif. (Industrial & Scientific Conference Management, Chicago, 1977), pp. 221–225. The properties of the confocal interferometer as they pertain to optical processing will be discussed in detail by Cederquist, Ph.D. thesis UCSD, (1980).
  6. The maximum phase shift that can be obtained in LiNbO3 is determined by crystal parameters such as iron-doping levels and the Fe+2:Fe+3 ratio and the crystal thickness. W. Burke at RCA Laboratories had suggested that a heavily doped, lightly reduced crystal would work best in this experiment, but he had no data on the specific sample that he gave us. It may be possible to increase the refractive-index change by optimizing the crystal parameters, and it is always possible to increase the phase shift by using a thicker crystal.
  7. D. Post, J. Opt. Soc. Am. 44, 243 (1954). This equation is not identical to the one in Post’s paper because the effect of the beam that suffers no reflections has been included. See B. J. Bartholomew, “Nonlinear Optical Processing with Fabry-Perot Interferometers,” Ph.D. thesis, UCSD, (1979). [CrossRef]
  8. The three-mirror interferometer in this configuration can be used as a very sensitive tool for measuring dispersion. The difference in the index of refraction at two wavelengths λ1 and λ2 is given by n(λ2) − n(λ1) = (d1 − d2)/te, where d1 and d2 are the distances between the plate and the solid étalon when fringes at λ1 and λ2 appear, and te is the étalon thickness. By increasing te, very small index changes can be observed.

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