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Applied Optics

Applied Optics


  • Vol. 19, Iss. 2 — Jan. 15, 1980
  • pp: 313–318

Normalization of the scattered light from a defect illuminated by a Gaussian beam

Paul E. Klingsporn  »View Author Affiliations

Applied Optics, Vol. 19, Issue 2, pp. 313-318 (1980)

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The intensity distribution of the beam from a laser operated in the TEM00 mode is Gaussian. In some applications it is desirable to have a uniform intensity over a certain region in space. For example, when a Gaussian beam is incident on a smooth surface containing small isolated defects the amount of light scattered by a defect will depend on the position of the defect relative to the center of the beam. In the past, several techniques have been devised to convert a Gaussian intensity profile into a uniform intensity over a specified region in space. In the present work a method of normalization is described that makes direct use of the Gaussian intensity distribution of the TEM00 mode. By this method, the amount of light scattered by a defect can be normalized to the value that would be observed if the defect were located at the center of the beam for a defect small in size compared with the 1/e2 diameter of the Gaussian profile. Experimental data were obtained that verify the theory.

© 1980 Optical Society of America

Original Manuscript: July 30, 1979
Published: January 15, 1980

Paul E. Klingsporn, "Normalization of the scattered light from a defect illuminated by a Gaussian beam," Appl. Opt. 19, 313-318 (1980)

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  1. C. S. Ih, Appl. Opt. 11, 694 (1972). [CrossRef]
  2. P. E. Klingsporn, Appl. Opt. 15, 2355 (1976). [CrossRef] [PubMed]
  3. S. S. Charschan, Ed., Lasers in Industry (Van Nostrand Reinhold, New York, 1972), pp. 481–483.
  4. J. L. Kreuzer, “Coherent Light Optical Systems Yielding an Output Beam of Desired Intensity Distribution at a Desired Equiphase Surface,” U.S. Patent3,476,463 (4November1969).

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