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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 1 — Jan. 1, 1981
  • pp: 82–89

Monitoring of optical coatings

H. A. Macleod  »View Author Affiliations


Applied Optics, Vol. 20, Issue 1, pp. 82-89 (1981)
http://dx.doi.org/10.1364/AO.20.000082


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Abstract

Monitoring implies the measurement and control of the parameters of optical thin films during deposition with the object of ensuring the production of an acceptable coating. Monitoring techniques usually concentrate on film thickness as the most important parameter. The principal monitoring arrangements in current use are surveyed with a brief account of their relative merits. It is shown that they are less able to cope with refractive-index errors than with simple thickness errors and that tight control of material parameters is required to take advantage of recent advances in monitoring techniques.

© 1981 Optical Society of America

History
Original Manuscript: June 25, 1980
Published: January 1, 1981

Citation
H. A. Macleod, "Monitoring of optical coatings," Appl. Opt. 20, 82-89 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-1-82


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References

  1. M. Banning, J. Opt. Soc. Am. 37, 792 (1947). [CrossRef] [PubMed]
  2. H. D. Polster, J. Opt. Soc. Am. 42, 21 (1952). [CrossRef]
  3. P. Giacomo, P. Jacquinot, J. Phys. Rad. 13, 59A (1952). [CrossRef]
  4. P. H. Lissberger, J. Ring, Opt. Acta, 2, 42 (1955). [CrossRef]
  5. F. S. Ritchie, Ph.D. Thesis, U. Reading, (1970). Summarized in H. A. Macleod, Thin Film Optical Filters, (Hilger, London, 1969).]
  6. H. A. Macleod, Opt. Acta 19, 1 (1972). [CrossRef]
  7. P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, Thin Solid Films 13, 285 (1972). [CrossRef]
  8. H. A. Macleod, E. Pelletier, Opt. Acta 24, 907 (1977). [CrossRef]
  9. V. A. Efremenko, Sov. J. Quantum Electron. 6, 289–293 (1976). [CrossRef]
  10. E. Pelletier, R. Kowalczyk, A. Fornier, Opt. Acta 20, 509 (1973). [CrossRef]
  11. B. Vidal, A. Fornier, E. Pelletier, Appl. Opt. 17, 1038 (1978). [CrossRef] [PubMed]
  12. B. Vidal, A. Fornier, E. Pelletier, Appl. Opt. 18, 3851 (1979). [PubMed]
  13. C. Holm, Appl. Opt. 18, 1978 (1979). [CrossRef] [PubMed]
  14. B. Vidal, E. Pelletier, Appl. Opt. 18, 3857 (1979). [PubMed]
  15. S. N. Jasperson, D. K. Burge, R. C. O’Handley, Surf. Sci. 37, 548 (1978). [CrossRef]
  16. K. H. Behrndt, Physics of Thin Films, G. Hass, R. E. Thun, Eds. (Academic, New York, 1966), Vol. 3, pp. 1–59.
  17. C. J. vd Laan, H. J. Frankena, Vacuum 27, 391 (1977). [CrossRef]
  18. H. K. Pulker, Opt. Spectra, 12(8), 43August, 1978).
  19. J. English, T. Putner, L. Holland, in Proceedings of the Fourth International Vacuum Congress (Institute of Physics and the Physical Society, London, 1968), pp. 491–95.
  20. D. J. Sandoz, Proc. IEE 123, 445 (1976).
  21. H. A. Macleod, Vacuum 27, 383 (1977). [CrossRef]
  22. H. K. Pulker, G. Paesold, E. Ritter, Appl. Opt. 15, 2986 (1976). [CrossRef] [PubMed]
  23. L. L. Matskevich, V. V. Bazhinov, Sov. J. Opt. Technol. 44, 98 (1977).
  24. All calculations for this paper were performed on a Texas Instrument TI Programmable 58 Calculator.
  25. T. M. Christmas, D. Richmond, Opt. Laser Technol. 9, 109 (June1977). [CrossRef]
  26. Yu. S. Rodichev, Sov. J. Opt. Technol. 42, 298 (1975).
  27. J. A. Dobrowolski, D. Lowe, Appl. Opt. 17, 3039 (1978). [CrossRef] [PubMed]

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