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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 15 — Aug. 1, 1981
  • pp: 2616–2619

Parallelism maps for optically contacted etalons

T. L. Killeen, P. B. Hays, and J. DeVos  »View Author Affiliations


Applied Optics, Vol. 20, Issue 15, pp. 2616-2619 (1981)
http://dx.doi.org/10.1364/AO.20.002616


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Abstract

A measurement technique is described that is capable of producing accurate numerical maps of the parallelism defect of optically contacted Fabry-Perot etalons. A photoelectric raster scan of the etalon transmission intensity distribution is performed at each of three closely spaced etalon tunings, one at maximum on-axis and two at the half-maxima on-axis positions. Simple data manipulation gives numerical or contour maps of the parallelism defect. Results demonstrating the effect of mechanical constraints on etalon parallelism are presented.

© 1981 Optical Society of America

History
Original Manuscript: February 1, 1981
Published: August 1, 1981

Citation
T. L. Killeen, P. B. Hays, and J. DeVos, "Parallelism maps for optically contacted etalons," Appl. Opt. 20, 2616-2619 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-15-2616


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References

  1. B. Bates, D. J. Bradley, T. Kohuo, H. W. Yates, J. Sci. Instrum. 43, 476 (1966).
  2. H. F. Dobele, J. H. Massig, Appl. Opt. 15, 69 (1976).
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