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Applied Optics

Applied Optics


  • Vol. 20, Iss. 15 — Aug. 1, 1981
  • pp: 2616–2619

Parallelism maps for optically contacted etalons

T. L. Killeen, P. B. Hays, and J. DeVos  »View Author Affiliations

Applied Optics, Vol. 20, Issue 15, pp. 2616-2619 (1981)

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A measurement technique is described that is capable of producing accurate numerical maps of the parallelism defect of optically contacted Fabry-Perot etalons. A photoelectric raster scan of the etalon transmission intensity distribution is performed at each of three closely spaced etalon tunings, one at maximum on-axis and two at the half-maxima on-axis positions. Simple data manipulation gives numerical or contour maps of the parallelism defect. Results demonstrating the effect of mechanical constraints on etalon parallelism are presented.

© 1981 Optical Society of America

Original Manuscript: February 1, 1981
Published: August 1, 1981

T. L. Killeen, P. B. Hays, and J. DeVos, "Parallelism maps for optically contacted etalons," Appl. Opt. 20, 2616-2619 (1981)

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