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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 15 — Aug. 1, 1981
  • pp: 2630–2634

Interferometric comparison of displacements by electronic speckle pattern interferometry

Ole J. Løkberg and Gudmunn Å. Slettemoen  »View Author Affiliations


Applied Optics, Vol. 20, Issue 15, pp. 2630-2634 (1981)
http://dx.doi.org/10.1364/AO.20.002630


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Abstract

Using the image waves from two similar objects as, respectively, object wave and reference wave in an electronic speckle pattern interferometer (ESPI) setup, it is possible to obtain interference patterns that indicate the amount of relative displacement between the two objects. Experimental results demonstrating direct interferometric subtraction and addition of vibration patterns are presented. Possible applications of the technique are also discussed.

© 1981 Optical Society of America

History
Original Manuscript: March 30, 1981
Published: August 1, 1981

Citation
Ole J. Løkberg and Gudmunn Å. Slettemoen, "Interferometric comparison of displacements by electronic speckle pattern interferometry," Appl. Opt. 20, 2630-2634 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-15-2630


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References

  1. O. J. Løkberg, Phys. Technol. 11, 16 (1980).
  2. G. Å. Slettemoen, Appl. Opt. 19, 616 (1980).
  3. C. C. Aleksoff, Appl. Phys. Lett. 14, 23 (1969).
  4. O. J. Løkberg, K. Høgmoen, Proc. Soc. Photo-Opt. Instrum. Eng. 136, 222 (1977).
  5. K. A. Stetson, J. Opt. Soc. Am. 60, 1378 (1970).
  6. N. E. Molin, K. A. Stetson, J. Phys. E: 2, 609 (1969).

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