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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 15 — Aug. 1, 1981
  • pp: 2694–2697

Interferometric measurement of time-varying longitudinal cavity modes in GaAs diode lasers

Paul Melman and W. John Carlsen  »View Author Affiliations


Applied Optics, Vol. 20, Issue 15, pp. 2694-2697 (1981)
http://dx.doi.org/10.1364/AO.20.002694


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Abstract

Measurement of mode chirping in a current-modulated semiconductor laser was performed using a Michelson interferometer. For a current step excitation, the rate of this chirping decays as a function of time, and two characteristic time constants were identified. Their interpretation is discussed, and the thermal impedance of the device is calculated. In addition, the significance of such a measurement for the analysis of chirp-induced modal noise in optical fibers is discussed, and experimental results are presented.

© 1981 Optical Society of America

History
Original Manuscript: March 12, 1981
Published: August 1, 1981

Citation
Paul Melman and W. John Carlsen, "Interferometric measurement of time-varying longitudinal cavity modes in GaAs diode lasers," Appl. Opt. 20, 2694-2697 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-15-2694

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