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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 15 — Aug. 1, 1981
  • pp: 2742–2746

Infrared optical properties of evaporated alumina films

T. S. Eriksson, A. Hjortsberg, G. A. Niklasson, and C. G. Granqvist  »View Author Affiliations


Applied Optics, Vol. 20, Issue 15, pp. 2742-2746 (1981)
http://dx.doi.org/10.1364/AO.20.002742


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Abstract

The dielectric function = 1 + i∊2 has been determined for Al2O3 films prepared by electron beam evaporation, in the 5–50-μm wavelength range. The data were extracted from spectrophotometric recordings of transmittance and reflectance by use of a novel technique. Supplementary measurements were made of the refractive index for visible and near-infrared wavelengths and of the dielectric constant at 1 MHz. Kramers-Kronig analysis was employed to check the consistency of our results for 1 and 2.

© 1981 Optical Society of America

History
Original Manuscript: March 12, 1981
Published: August 1, 1981

Citation
T. S. Eriksson, A. Hjortsberg, G. A. Niklasson, and C. G. Granqvist, "Infrared optical properties of evaporated alumina films," Appl. Opt. 20, 2742-2746 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-15-2742

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