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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 15 — Aug. 1, 1981
  • pp: 2747–2753

Optical constants of absorbing materials: a new approach

C. L. Nagendra and G. K. M. Thutupalli  »View Author Affiliations


Applied Optics, Vol. 20, Issue 15, pp. 2747-2753 (1981)
http://dx.doi.org/10.1364/AO.20.002747


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Abstract

A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (Rs) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R1s and R2s) in the form of R1s/Rs and R2s/Rs. It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces.

© 1981 Optical Society of America

History
Original Manuscript: January 24, 1981
Published: August 1, 1981

Citation
C. L. Nagendra and G. K. M. Thutupalli, "Optical constants of absorbing materials: a new approach," Appl. Opt. 20, 2747-2753 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-15-2747


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