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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 18 — Sep. 15, 1981
  • pp: 3238–3244

Images of phase edges in conventional and scanning optical microscopes

T. Wilson  »View Author Affiliations


Applied Optics, Vol. 20, Issue 18, pp. 3238-3244 (1981)
http://dx.doi.org/10.1364/AO.20.003238


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Abstract

The images of strong phase edges are calculated for conventional and confocal microscopes operating in the bright-field, dark-field, Zernike, and interference contrast modes by a method which has considerable computational advantages. It is found that in general the confocal images are superior possessing higher contrast than the conventional ones, and the equivalence with the direct view microscope is discussed.

© 1981 Optical Society of America

History
Original Manuscript: March 2, 1981
Published: September 15, 1981

Citation
T. Wilson, "Images of phase edges in conventional and scanning optical microscopes," Appl. Opt. 20, 3238-3244 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-18-3238

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