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Applied Optics

Applied Optics


  • Vol. 20, Iss. 18 — Sep. 15, 1981
  • pp: 3259–3262

Evaluation of irradiance distributions for Fresnel diffraction patterns

B. J. Pernick  »View Author Affiliations

Applied Optics, Vol. 20, Issue 18, pp. 3259-3262 (1981)

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A rotated coordinate system is used to evaluate the irradiance distribution of a Fresnel diffraction pattern. Arbitrary diffracting objects are defined in a bounded input plane. Fresnel patterns for linear chirp functions are simply related to the single-slit pattern. Features of the single-slit pattern are developed for use as optical system design criteria.

© 1981 Optical Society of America

Original Manuscript: April 16, 1981
Published: September 15, 1981

B. J. Pernick, "Evaluation of irradiance distributions for Fresnel diffraction patterns," Appl. Opt. 20, 3259-3262 (1981)

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