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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 19 — Oct. 1, 1981
  • pp: 3274–3275

Explicit determination of thickness of a transparent film on a transparent substrate from angles of incidence of equal p and s reflectivities

R. M. A. Azzam  »View Author Affiliations


Applied Optics, Vol. 20, Issue 19, pp. 3274-3275 (1981)
http://dx.doi.org/10.1364/AO.20.003274


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No abstract available.

History
Original Manuscript: April 27, 1981
Published: October 1, 1981

Citation
R. M. A. Azzam, "Explicit determination of thickness of a transparent film on a transparent substrate from angles of incidence of equal p and s reflectivities," Appl. Opt. 20, 3274-3275 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-19-3274


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References

  1. F. Abelès, J. Phys. Radium 11, 310 (1950). [CrossRef]
  2. G. Jungk, Phys. Status. Solidi. A 34, 69 (1976). [CrossRef]
  3. A. R. Reisinger, H. B. Morris, K. L. Lawley, Opt. Eng. 20, 111 (1981). [CrossRef]
  4. R. M. A. Azzam, A.-R. M. Zaghloul, J. Opt. (Paris) 8, 201 (1977). [CrossRef]
  5. G. Jungk, Phys. Status Solidi A 42, 267 (1977). [CrossRef]
  6. A.-R. M. Zaghloul, R. M. A. Azzam, J. Opt. Soc. Am. 67, 1286 (1977). [CrossRef]
  7. A.-R. M. Zaghloul, R. M. A. Azzam, N. M. Bashara, J. Opt. Soc. Am. 65, 1043 (1975). [CrossRef]
  8. See, for example, R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), Sec. 4.4.
  9. R. M. A. Azzam, A.-R. M. Zaghloul, N. M. Bashara, J. Opt. Soc. Am. 65, 252 (1975). [CrossRef]
  10. Exact mirror-image symmetry with respect to the real axis occurs only if the substrate is transparent. Substrate absorption causes asymmetry.
  11. For example, by use of circular polarization filters (e.g., of the sheet type) of known handedness.

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