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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 2 — Jan. 15, 1981
  • pp: 231–234

Infrared He–Xe laser interferometry for measuring length

Hirokazu Matsumoto  »View Author Affiliations


Applied Optics, Vol. 20, Issue 2, pp. 231-234 (1981)
http://dx.doi.org/10.1364/AO.20.000231


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Abstract

A technique is described for determining absolute lengths up to 3 m from measurement of the interference fringe fractions for multiple wavelengths. The required accuracies of the wavelength ratio and fringe fraction reading are analyzed. To satisfy the accuracies, a low-cost simply stabilized He–Xe laser, operating simultaneously at two wavelengths, 3.51 and 3.37 μm, was developed. Using this laser the preliminary measurement of the wavelength ratio was made interferometrically with the length standard of a gauge block.

© 1981 Optical Society of America

History
Original Manuscript: July 7, 1980
Published: January 15, 1981

Citation
Hirokazu Matsumoto, "Infrared He–Xe laser interferometry for measuring length," Appl. Opt. 20, 231-234 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-2-231


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