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Applied Optics

Applied Optics


  • Vol. 20, Iss. 4 — Feb. 15, 1981
  • pp: 610–618

Optical heterodyne profilometry

Gary E. Sommargren  »View Author Affiliations

Applied Optics, Vol. 20, Issue 4, pp. 610-618 (1981)

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A noncontact optical technique for the measurement of surface profile is described, which has a height sensitivity of the order of 1 Å. It is based on a common path heterodyne interferometer in which two orthogonally polarized beams of slightly different frequency are focused on the surface to be measured. One focal point acts as a reference as the other point circularly scans the surface. The phase of the beat frequency of the interfering return beams is directly proportional to the surface height. The results of a surface measurement include graphical displays of the surface profile, autocovariance function, spectral density function, stability, and repeatability. Comparison with other instruments is also discussed.

© 1981 Optical Society of America

Original Manuscript: June 30, 1980
Published: February 15, 1981

Gary E. Sommargren, "Optical heterodyne profilometry," Appl. Opt. 20, 610-618 (1981)

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