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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 20, Iss. 9 — May. 1, 1981
  • pp: 1724–1726

Defect-type discriminating optical system

Akito Iwamoto and Hidekazu Sekizawa  »View Author Affiliations


Applied Optics, Vol. 20, Issue 9, pp. 1724-1726 (1981)
http://dx.doi.org/10.1364/AO.20.001724


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Abstract

Novel coherent optical defect detecting methods, which can distinguish between opaque defects and transparent defects, are proposed. One of these novel methods makes use of a holographylike polarity reference signal and is suited to automatic detection systems. The other employs two independent light sources, and suitable for visual detection systems. Realizing these novel methods using omnidirectional spatial filters, simple but effective periodic pattern defect-detecting systems are formed, which can be easily accommodated with defect touching-up stages.

© 1981 Optical Society of America

History
Original Manuscript: August 13, 1980
Published: May 1, 1981

Citation
Akito Iwamoto and Hidekazu Sekizawa, "Defect-type discriminating optical system," Appl. Opt. 20, 1724-1726 (1981)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-20-9-1724


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References

  1. L. S. Watkins, Proc. IEEE, 57, 1634 (1969). [CrossRef]
  2. A. Iwamoto, H. Sekizawa, Appl. Opt. 19, 1196 (1980). [CrossRef] [PubMed]
  3. R. J. Collier, C. B. Burckhardt, L. H. Lin, Optical Holography (Academic, New York, 1971).

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