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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 21, Iss. 11 — Jun. 1, 1982
  • pp: 2027–2035

Nonlinear response of low-background extrinsic silicon detectors. 2: A revised model

Alexander S. Zachor, E. Ray Huppi, I. Coleman, and D. G. Frodsham  »View Author Affiliations


Applied Optics, Vol. 21, Issue 11, pp. 2027-2035 (1982)
http://dx.doi.org/10.1364/AO.21.002027


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Abstract

A revised model is described for computing the nonlinear response of low-background Si:X photoconductive detectors to a given flux variation. The model gives results in good agreement with measured responses to large-amplitude sine wave and square wave flux modulations and implies a simple measurement procedure for calibrating a detector’s nonlinear response.

Citation
Alexander S. Zachor, E. Ray Huppi, I. Coleman, and D. G. Frodsham, "Nonlinear response of low-background extrinsic silicon detectors. 2: A revised model," Appl. Opt. 21, 2027-2035 (1982)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-11-2027

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