A fog chamber, developed to support measurement of the performance of electrooptical devices in the presence of fog, is discussed. Rationale for the fog chamber concept is presented. Emphasis is placed on the theory of operation of the chamber, an optical method for assessing fog particle characteristics, and the optical properties of the different types of fog produced.
© 1982 Optical Society of America
Original Manuscript: January 29, 1982
Published: July 1, 1982
D. K. Cohen, John H. Hunt, and Devon G. Crowe, "Characteristics of a chamber used for electrooptical device performance measurements in the presence of fog," Appl. Opt. 21, 2399-2404 (1982)