Interference effects, including multiple-beam and wide-angle, associated with luminescence from within a thin film are described. A simple geometrical model is used to calculate the s- and p-polarized luminescent light assuming electric-dipole radiation. The luminescence exhibits fringes when measured both as a function of the film thickness and as a function of the wavelength of the light. In the latter case the fringes can also show a beating effect. The model is applied to several experimental examples of cathodoluminescence in SiO2 and an example of photoluminescence in a-Si.
© 1982 Optical Society of America
Original Manuscript: April 20, 1982
Published: July 15, 1982
R. T. Holm, S. W. McKnight, E. D. Palik, and W. Lukosz, "Interference effects in luminescence studies of thin films," Appl. Opt. 21, 2512-2519 (1982)