A new apparatus that incorporates an integrating sphere is described, which enables the solar transmittance of test samples to be measured as a function of both angle of incidence and azimuth angle. This apparatus was developed to perform measurements on both planar and nonplanar samples of larger dimensions than can be accommodated in a spectrophotometer. Solar transmittance measurements from this apparatus are compared with those from a Gier & Dunkle spectrophotometer for a range of sample materials, and excellent agreement has been found. Errors in solar transmittance measurement may arise from changes in the integrating sphere entrance port reflectance due to placement and then the removal of the test sample from the port. A correction procedure is derived to take account of these errors and is applicable to all single-beam integrating spheres.
© 1982 Optical Society of America
Original Manuscript: November 12, 1981
Published: August 1, 1982
J. G. Symons, E. A. Christie, and M. K. Peck, "Integrating sphere for solar transmittance measurement of planar and nonplanar samples," Appl. Opt. 21, 2827-2832 (1982)