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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 21, Iss. 16 — Aug. 15, 1982
  • pp: 2906–2911

Determining tunable diode laser spectrometer performance through measurement of N2O line intensities and widths at 7.8 μm

Da-Wun Chen, Edward R. Niple, and Sherman K. Poultney  »View Author Affiliations


Applied Optics, Vol. 21, Issue 16, pp. 2906-2911 (1982)
http://dx.doi.org/10.1364/AO.21.002906


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Abstract

The N2O R(8) doublet of the 1110–0110 band at 7.8 μm was measured by a tunable diode laser spectrometer designed and assembled at Perkin-Elmer. The spectra were digitized and least-squares fitted to Voigt line profiles to yield N2O line parameters and a quantitative measure of instrument performance. Scans at various pressures produced consistent spectral line values: S0 = (0.1746 ± 0.0043)cm−2/atm at 300 K, αL(N2O − N2O) = (0.1066 ± 0.0041)cm−1/atm, αD = (1.194 ± 0.018) × 10−3 cm−1, and αL(N2O − N2) = (0.0870 ± 0.0015)cm−1/atm. A spectrum with several levels of synthetic noise added was used to verify the fitting algorithm’s stability. The spectrometer was shown to possess an excellent SNR (e.g., 900:1) and wave number precision (≤2 × 10−4 cm−1) for spectral scans with 0.1-sec time constant.

© 1982 Optical Society of America

History
Original Manuscript: April 2, 1982
Published: August 15, 1982

Citation
Da-Wun Chen, Edward R. Niple, and Sherman K. Poultney, "Determining tunable diode laser spectrometer performance through measurement of N2O line intensities and widths at 7.8 μm," Appl. Opt. 21, 2906-2911 (1982)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-16-2906

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